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Showing 10 out of a total of 31 results for community: Physics.
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Characterization of process and radiation induced defects in Si and Ge using conventional deep level transient spectroscopy (DLTS) and Laplace-DLTS
Unknown author
(
University of Pretoria
,
2010-05-26
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
Laplace current deep level transient spectroscopy measurements of defect states in methylammonium lead bromide single crystals
Rosenberg, John W.
;
Legodi, M.J. (Matshisa Johannes)
;
Rakita, Yevgeny
;
Cahen, David
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2017
)
Electronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction band
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Janse van Rensburg, Pieter Johan
;
Hayes, M.
;
Nel, Jacqueline Margot
;
Von Wenckstern, Holger
;
Schmidt, H.
;
Biehne, G.
;
Hochmuth, H.
;
Lorenz, M.
;
Grundmann, Marius
(
Elsevier
,
2007-12
)
Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS
Nyamhere, Cloud
;
Deenapanray, P.N.K.
;
Auret, Francois Danie
;
Farlow, F.C.
(
Elsevier
,
2006
)
Introduction and annealing of primary defects in proton-bombarded n-GaN
Schmidt, Matthias
;
De Meyer, Hannes
;
Jansen van Rensburg, P.J.
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Wiley
,
2014-01
)
Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition
Nyamhere, Cloud
;
Chawanda, Albert
;
Das, A.G.M.
;
Auret, Francois Danie
;
Hayes, M.
(
Elsevier
,
2007-12-15
)
Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC
Igumbor, Emmanuel
;
Olaniyan, Okikiola
;
Mapasha, Refilwe Edwin
;
Danga, Helga Tariro
;
Omotoso, Ezekiel
;
Meyer, Walter Ernst
(
IOP Publishing
,
2018-04
)
Electrical characterization of process, annealing and irradiation induced defects in ZnO
Unknown author
(
University of Pretoria
,
2013-04-24
)
Electrical and structural characterization of metal germanides
Unknown author
(
University of Pretoria
,
2010
)
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Author
Auret, Francois Danie (18)
Meyer, Walter Ernst (17)
Coelho, Sergio M.M. (8)
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Diale, M. (Mmantsae Moche) (7)
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Janse van Rensburg, Pieter Johan (6)
Nyamhere, Cloud (5)
Legodi, Matshisa Johannes (4)
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Defects (31)
Deep level transient spectroscopy (8)
Density functional theory (DFT) (7)
Charge state (6)
Deep level transient spectroscopy (DLTS) (6)
DLTS (5)
Formation energy (5)
Germanium (5)
Deep-level transient spectroscopy (DLTS) (4)
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2010 - 2018 (23)
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