Pienaar, J.; Meyer, Walter Ernst; Auret, Francois Danie; Coelho, Sergio M.M.
(Elsevier, 2012-05)
Deep Level Transient Spectroscopy (DLTS) was used to measure the field enhanced emission rate from a defect introduced in n-type Ge. The defect was introduced through low energy (±80 eV) inductively coupled plasma (ICP) ...