Browsing Physics by Subject "Laplace-DLTS"

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Deep level transient spectroscopy (DLTS) study of defects introduced in antimony doped Ge by 2 MeV proton irradiation

Nyamhere, Cloud; Das, A.G.M.; Auret, Francois Danie; Chawanda, Albert; Pineda-Vargas, C.A.; Venter, Andre (Elsevier, 2011-08)

Please read the abstract in the article.
Electrical characterisation of electron beam exposure induced defects in silicon

Danga, Helga Tariro; Auret, Francois Danie; Coelho, Sergio M.M.; Diale, M. (Mmantsae Moche) (Elsevier, 2016-01)

The defects introduced in epitaxially grown p-type silicon (Si) during electron beam exposure were electrically characterised using deep level transient spectroscopy (DLTS) and high resolution Laplace-DLTS. In this process, ...
Electrical characterization of deep levels created by bombarding nitrogen-doped 4HSiC with alpha-particle irradiation

Omotoso, Ezekiel; Meyer, Walter Ernst; Auret, Francois Danie; Paradzah, Alexander Tapera; Legodi, Matshisa Johannes (Elsevier, 2016-03)

Deep-level transient spectroscopy (DLTS) and Laplace-DLTS were used to investigate the effect of alpha-particle irradiation on the electrical properties of nitrogen-doped 4H-SiC. The samples were bombarded with alpha-particles ...

Now showing items 1-3 of 3

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