Numerous experiments on defect formation in insulators, metals, alloys, and amorphous semiconductors have shown that these materials are sensitive to track formation when they are bombarded by swift heavy ions (SHI). Detail ...

The influence of swift heavy ions (SHIs) irradiation on the microstructure and the migration behavior of strontium (Sr) implanted into polycrystalline SiC were investigated using Rutherford backscattering spectrometry ...

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