Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
- UPSpace Home
- →
- Natural and Agricultural Sciences
- →
- Physics
- →
- Research Articles (Physics)
- →
- View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
| dc.contributor.author | Nyamhere, Cloud
|
|
| dc.contributor.author | Das, A.G.M.
|
|
| dc.contributor.author | Auret, Francois Danie
|
|
| dc.contributor.author | Chawanda, Albert
|
|
| dc.contributor.author | Mtangi, Wilbert
|
|
| dc.contributor.author | Odendaal, R.Q. (Quintin)
|
|
| dc.contributor.author | Carr, Alan
|
|
| dc.date.accessioned | 2009-10-28T06:11:58Z | |
| dc.date.available | 2009-10-28T06:11:58Z | |
| dc.date.issued | 2009 | |
| dc.description.abstract | Please read abstract in article | en_US |
| dc.identifier.citation | C.Nyamhere, et al., Physica B (2009), doi:10.1016/j.physb.2009.09.037 | en_US |
| dc.identifier.issn | 0921-4526 | |
| dc.identifier.other | 10.1016/j.physb.2009.09.037 | |
| dc.identifier.uri | http://hdl.handle.net/2263/11608 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.rights | Elsevier | en_US |
| dc.subject | Laplace DLTS | en |
| dc.subject | DLTS | en |
| dc.subject | Defects | en |
| dc.subject.lcsh | Deep level transient spectroscopy | en |
| dc.subject.lcsh | Laplace transformation | en |
| dc.subject.lcsh | Sputtering (Physics) | en |
| dc.subject.lcsh | Germanium | en |
| dc.title | Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS) | en_US |
| dc.type | Postprint Article | en_US |
