Thabethe, Thabsile TheodoraNtsoane, Tshepo PaulBiira, SaphinaNjoroge, Eric GitauHlatshwayo, Thulani ThokozaniSkuratov, Vladimir AlexeevichMalherbe, Johan B.2020-04-072020-04Thabethe, T.T., Ntsoane, T.P., Biira, S. et al. 2020, 'Investigating the structural changes induced by SHI on W–SiC samples', Vacuum, vol. 174, art. 109230, pp. 1-5.0042-207X (print)1879-2715 (online)10.1016/j.vacuum.2020.109230http://hdl.handle.net/2263/74075Please read abstract in the article.en© 2020 Elsevier Ltd. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Vacuum. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Vacuum, vol. 174, art. 109230, pp. 1-5, 2020. doi : 10.1016/j.vacuum.2020.109230.Swift heavy ion (SHI)Rutherford backscattering spectrometry (RBS)Scanning electron microscopy (SEM)X-ray diffraction (XRD)TungstenThin filmReactionIrradiationMetal-silicon carbide (m-SiC)Postprint Article