Nel, Hendrik P.Dualibe, Fortunato CarlosStander, Tinus2024-04-152024-04-152023H.P. Nel, F.C. Dualibe and T. Stander, "Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers," in IEEE Open Journal of Circuits and Systems, vol. 4, pp. 70-84, 2023, doi: 10.1109/OJCAS.2022.3232638.2644-1225 (online)10.1109/OJCAS.2022.3232638http://hdl.handle.net/2263/95512Please read abstract in the article.enThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.Oscillation-based testing (OBT)Oscillation-based built-in self-testing (OBIST)Circuit faultsIntegrated circuit modelingBuilt-in self-testCircuit simulationProcess, voltage and temperature (PVT)CMOS technologyComplementary metal-oxide semiconductor (CMOS)Design for testabilityMicrowave integrated circuitsFault detectionCircuit simulationDesign for testabilityLow-noise amplifier (LNA)SDG-09: Industry, innovation and infrastructureArticle