Manyala, Ncholu I.Ngom, Balla D.Beye, A.C.Bucher, RemyMaaza, MalikStrydom, Andre M.Forbes, AndrewJohnson, Alan T. CharlieDiTusa, J.F.2010-03-042010-03-042009-08-06Manyala, N, Ngom, BD, Beye, AC, Bucher, R, Maaza, M, Strydom, A, Forbes, A, Johnson, ATC & DiTusa, JF 2009, 'Structural and magnetic properties of ε-Fe1-xCoxSi thin films deposited via pulsed laser deposition', Applied Physics Letters, vol. 94, no. 23, pp. 232-503. [http://apl.aip.org/]0003-6951http://hdl.handle.net/2263/13312We report pulsed laser deposition synthesis and characterization of polycrystalline Fe1-xbCoxSi thin films on Si (111). X-ray diffraction, transmission electron, and atomic force microscopies reveal films to be dense, very smooth, and single phase with a cubic B20 crystal structure. Ferromagnetism with significant magnetic hysteresis is found for all films including nominally pure FeSi films in contrast to the very weak paramagnetism of bulk FeSi. For Fe1-xCoxSi this signifies a change from helimagnetism in bulk, to ferromagnetism in thin films. These ferromagnetic thin films are promising as a magnetic-silicide/silicon system for polarized current production, manipulation, and detection.enAmerican Institute of PhysicsThin films -- Magnetic propertiesPulsed laser depositionPolycrystalsFerromagnetismSiliconTransmission electron microscopesAtomic force microscopyParamagnetismArticle