Mayhew-Ridgers, GordonVan Jaarsveld, Paul A.Odendaal, J.W. (Johann Wilhelm)2023-11-292023-11-292023-09Mayhew-Ridgers, G., Van Jaarsveld, P.A. & Odendaal, J.W. 2023, 'Three-antenna characterization techniques employing spherical near-field scanning with higher-order probe correction', IEEE Transactions on Antennas and Propagation, vol. 71, no. 9, pp. 7220-7228, doi : 10.1109/TAP.2023.3295492.0018-926X (print)1558-2221 (online)10.1109/TAP.2023.3295492http://hdl.handle.net/2263/93502The three-antenna technique is typically used in the context of absolute-gain measurements where no gain standard is required. When implemented in a spherical near-field test range, the conventional approach is to use near-field-to-far-field transformation algorithms with first-order probe correction, which severely limits the choice of antennas that can occupy the probe position. Two new techniques, which are based on higher-order probe correction, are presented. These enable the full characterization of up to three higher-order antennas. The first technique, where only two of the antennas need to occupy the probe position, is useful for the accurate characterization of at least the antenna that is not employed as a probe. The second technique, where all antennas, in turn, occupy the probe position, allows for the accurate characterization of each antenna.en© 2023 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.Antenna measurementsAntenna radiation patternsGain measurementNear fieldsNear-field-to-far-field transformationProbe antennasMathematical modelsReceiving antennasProbesAntenna testingThree-antenna techniqueSpherical near-field test rangeProbe positionNear-field scanningHigher-order probe correctionHigher-order antennasGain standardFirst-order probe correctionAbsolute-gain measurementsAntenna characterization techniquesPostprint Article