Malela-Majika, Jean-ClaudeMotsepa, C.M.Graham, Marien Alet2019-06-182021J. C. Malela-Majika, C. M. Motsepa & M. A. Graham (2021): A new double sampling X control chart for monitoring an abrupt change in the process location, Communications in Statistics - Simulation and Computation, 50(3): 917-935, DOI: 10.1080/03610918.2019.1577970. NYP.0361-0918 (print)1532-4141 (online)10.1080/03610918.2019.1577970http://hdl.handle.net/2263/70226This paper develops a new double sampling (DS) monitoring scheme, namely, the side-sensitive DS X chart, to monitor the process mean. The operational procedure is presented first followed by the exact form of the probability of the in-control process under the normality assumption. Finally, the performance of the new scheme is investigated by minimizing the out-of-control average run-length and extra quadratic loss function. It was observed that the proposed chart presents a better overall performance than the existing DS X chart. An illustrative example is given to facilitate the design and implementation of the new chart.en© 2019 Taylor & Francis Group, LLC. This is an electronic version of an article published in Communications in Statistics : Simulation and Computation, vol. 50, no. 3, pp. 917-935, 2021. doi : 10.1080/03610918.2019.1577970. Communications in Statistics : Simulation and Computation is available online at : http://www.tandfonline.comloi/lssp20.Double sampling (DS)DS control chartStatistical process monitoringSide-sensitive DS schemeOverall performance measuresRun length distributionA new double sampling X control chart for monitoring an abrupt change in the process locationPostprint Article