Madito, M.J. (Moshawe)Ismail, Mahjoub Yagoub AbdallaHlatshwayo, Thulani ThokozaniMtshali, C.B.2021-11-232021-11-232020-03Madito, M.J., Ismail, M.Y.A., Hlatshwayo, T.T. et al. 2020, 'The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis', Applied Surface Science, vol. 506, art. 145001, pp. 1-8.0169-4332 (print)1873-5584 (online)10.1016/j.apsusc.2019.145001http://hdl.handle.net/2263/82805Please read abstract in the article.en© 2020 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Applied Surface Science. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Applied Surface Science, vol. 506, art. 145001, pp. 1-8, 2020. doi : 10.1016/j.apsusc.2019.145001.Glassy carbon electrodes (GCE)Sp3 hybridizationBoundary defectsXe ionsIon implantationRaman spectroscopyPostprint Article