Habeenzu, BrilliantMeyer, Walter ErnstStander, Tinus2021-04-072021-04-072020-04Habeenzu, B., Meyer, W. & Stander, T. 2020, 'Effect of electron radiation on small-signal parameters of NMOS devices at mm-wave frequencies', Microelectronics Reliability, vol. 107, art. 113598, pp. 1-12.0026-271410.1016/j.microrel.2020.113598http://hdl.handle.net/2263/79326Please read abstract in the article.en© 2020 Elsevier Ltd. All rights2020 Elsevier Ltd. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Microelectronics Reliability. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Microelectronics Reliability, vol. 107, art. 113598, pp. 1-12, 2020. doi : 10.1016/j.microrel.2020.113598.Postprint Article