Hlatshwayo, Thulani ThokozaniMtshonisi, N.Njoroge, Eric GitauMlambo, MbusoMsimanga, M.Skuratov, Vladimir AlexeevichO'Connell, J.H.Malherbe, Johan B.Motloung, Setumo Victor2021-09-012021-09-012020-06Hlatshwayo, T.T., Mtshonisi, N., Njoroge, E.G. et al. 2020, 'Effects of Ag and Sr dual ions implanted into SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 472, pp. 7-13.0168-583X (print)1872-9584 (online)10.1016/j.nimb.2020.03.035http://hdl.handle.net/2263/81576Please read abstract in the article.en© 2020 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 472, pp. 7-13, 2020. doi : 10.1016/j.nimb.2020.03.035.Silver (Ag)Strontium (Sr)Silicon carbide (SiC)Sr and implantationRaman spectroscopyRadiation damageTransmission electron microscopy (TEM)Elastic recoil detection analysis (ERDA)Rutherford backscattering spectrometry (RBS)Scanning electron microscopy (SEM)Postprint Article