tinus.stander@up.ac.zaPetrashin PabloToledo, LuisLancioni, Walter2017-03-062017-03-062017-02Petrashin, PA, Toledo, LE, Lancioni, W , Stander, T & Osuch, PJ 2017, 'Oscillation-based test in a CCII-based bandpass filter', 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017, pp. 17-20.http://hdl.handle.net/2263/59274Paper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017.Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first time. Adopting a CCII-based band pass filter as a case study, it is shown that OBT can be implemented with a minimally intrusive switched feedback loop to establish the oscillator. Exhaustive fault simulation indicates 98.11% detection of possible short circuit and 100% detection of possible open circuit faults in the circuit under test, in both 0.35μm and 1.2μm CMOS technology nodes.en© 2017 Institute of Electrical and Electronics EngineersContinuous time filtersAnalog testingFault simulationTestingOscillation based testing (OBT)Second-generation current conveyor (CCII)Oscillation-based test in a CCII-based bandpass filterText