Design and manufacture of quantum-confined SI light sources

dc.contributor.authorBogalecki, Alfons Willi
dc.contributor.authorDu Plessis, Monuko
dc.contributor.emailalfons.bogalecki@up.ac.zaen_US
dc.date.accessioned2011-06-15T15:11:59Z
dc.date.available2011-06-15T15:11:59Z
dc.date.issued2010-03
dc.description.abstractTo investigate quantum confinement effects on silicon (Si) light source electroluminescence (EL), nanometre-scale Si finger junctions were manufactured in a fully customized silicon-on-insulator (SOI) production technology. The wafers were manufactured in the cleanroom using an electro-beam pattern generator (EPG). The SOI light source with the highest irradiance emitted about 9 times more optical power around = 850 m than a 0.35 m bulk-CMOS avalanche light-source operating at the same time current. It is shown that the buried oxide (BOX) layer in a SOI process could be used to reflect about 25% of otherwise lost downward-radiated light back up to increase the external power efficiency of SOI light sources.en_US
dc.identifier.citationBogalecki, AW & Du Plessis, M 2010, 'Design and manufacture of quantum-confined SI light sources', SAIEE Africa Research Journal, vol. 101, no. 1, pp. 11-16. [http://www.saiee.org.za//content.php?pageID=200#]en_US
dc.identifier.issn1234-4321
dc.identifier.urihttp://hdl.handle.net/2263/16853
dc.language.isoenen_US
dc.publisherSouth African Institute of Electrical Engineersen_US
dc.rightsSouth African Institute of Electrical Engineersen_US
dc.subjectNanometre-scale SOIen_US
dc.subjectSilicon light sourceen_US
dc.subjectQuantum confinementen_US
dc.subjectSilicon electroluminescenceen_US
dc.subject.lcshElectroluminescent devicesen
dc.subject.lcshSilicon-on-insulator technologyen
dc.titleDesign and manufacture of quantum-confined SI light sourcesen_US
dc.typeArticleen_US

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