Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC

dc.contributor.authorAbdelbagi, Hesham Abdelbagi Ali
dc.contributor.authorSkuratov, Vladimir Alexeevich
dc.contributor.authorMotloung, Setumo Victor
dc.contributor.authorNjoroge, Eric Gitau
dc.contributor.authorMlambo, Mbuso
dc.contributor.authorMalherbe, Johan B.
dc.contributor.authorO'Connell, Jacques H.
dc.contributor.authorHlatshwayo, Thulani Thokozani
dc.contributor.emailthulani.hlatshwayo@up.ac.zaen_ZA
dc.date.accessioned2020-03-06T05:31:03Z
dc.date.issued2019-12
dc.description.abstractPlease read abstract in the article.en_ZA
dc.description.departmentPhysicsen_ZA
dc.description.embargo2020-12-15
dc.description.librarianhj2020en_ZA
dc.description.urihttp://www.elsevier.com/locate/nimben_ZA
dc.identifier.citationAbdelbagi, H.A.A., Skuratov, V.A., Motloung, S.V. et al. 2019, 'Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 461, pp. 201-209.en_ZA
dc.identifier.issn0168-583X (print)
dc.identifier.issn1872-9584 (online)
dc.identifier.other10.1016/j.nimb.2019.10.002
dc.identifier.urihttp://hdl.handle.net/2263/73648
dc.language.isoenen_ZA
dc.publisherElsevieren_ZA
dc.rights© 2019 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 461, pp. 201-209, 2019. doi : 10.1016/j.nimb.2019.10.002.en_ZA
dc.subjectSwift heavy ion (SHI)en_ZA
dc.subjectRutherford backscattering spectrometry (RBS)en_ZA
dc.subjectStructureen_ZA
dc.subjectSiCen_ZA
dc.subjectScanning electron microscopy (SEM)en_ZA
dc.subjectRaman spectroscopyen_ZA
dc.subjectTransmission electron microscopy (TEM)en_ZA
dc.titleEffect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiCen_ZA
dc.typePostprint Articleen_ZA

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