Statistical and fractal analysis of nitrogen ion implanted tantalum thin films

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Date

2020-06

Authors

Ramezani, A.H.
Hoseinzadeh, Siamak
Ebrahiminejad, Zh.

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Publisher

Springer

Abstract

Please read abstract in the article.

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Keywords

Tantalum bulk, Nitrogen ion implantation, Monofractal analysis, Fractal dimension

Sustainable Development Goals

SDG-04: Quality education
SDG-07: Affordable and clean energy
SDG-09: Industry, innovation and infrastructure
SDG-12: Responsible consumption and production

Citation

Ramezani, A.H., Hoseinzadeh, S. & Ebrahiminejad, Z. Statistical and fractal analysis of nitrogen ion implanted tantalum thin films. Applied Physics A 126, 481 (2020). https://doi.org/10.1007/s00339-020-03671-7.

URI

http://hdl.handle.net/2263/77242

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Research Articles (Mechanical and Aeronautical Engineering)
Research Articles (University of Pretoria)
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