Characterization of diode-connected heterojunction bipolar transistors for near-infrared detecting applications

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Authors

Venter, J.J.P. (Johannes)
Sinha, Saurabh
Lambrechts, Wynand

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Publisher

Society of Photo-optical Instrumentation Engineers

Abstract

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Keywords

Infrared radiation photodetectors, Circuit noise, Diode-connected transistor, Cryogenic operation, Heterojunction bipolar transistor (HBT)

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Citation

Johan Venter, Saurabh Sinha, Wynand Lambrechts, “Characterization of diode-connected heterojunction bipolar transistors for near-infrared detecting applications,” Opt. Eng. 57(11), 117104 (2018), DOI: 10.1117/1.OE.57.11.117104.