Effects of Ag and Sr dual ions implanted into SiC
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Date
Authors
Hlatshwayo, Thulani Thokozani
Mtshonisi, N.
Njoroge, Eric Gitau
Mlambo, Mbuso
Msimanga, M.
O'Connell, J.H.
Malherbe, Johan B.
Motloung, Setumo Victor
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Publisher
Elsevier
Abstract
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Keywords
Silver (Ag), Strontium (Sr), Silicon carbide (SiC), Sr and implantation, Raman spectroscopy, Radiation damage, Transmission electron microscopy (TEM), Elastic recoil detection analysis (ERDA), Rutherford backscattering spectrometry (RBS), Scanning electron microscopy (SEM)
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Citation
Hlatshwayo, T.T., Mtshonisi, N., Njoroge, E.G. et al. 2020, 'Effects of Ag and Sr dual ions implanted into SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 472, pp. 7-13.