Influence of ammonia concentration on the microstructure, electrical and Raman properties of low temperature chemical bath deposited ZnO nanorods

dc.contributor.upauthorMwankemwa, Benard S.
dc.contributor.upauthorNambala, Fred Joe
dc.contributor.upauthorKyeyune, Farooq
dc.contributor.upauthorlatshwayo, Thulani Thokozani
dc.contributor.upauthorNel, Jacqueline Margot
dc.contributor.upauthorDiale, M. (Mmantsae Moche)
dc.date.accessioned2017-09-05T06:17:33Z
dc.date.issued2017-11
dc.description.abstractNanostructured zinc oxide synthesized using an easy and low temperature chemical bath deposition method are among the most promising low cost semiconducting nanostructures investigated for a variety of applications. We successfully report the effects of ammonia solution in the growth of ZnO nanorods at a temperature of 60 °C. Successive addition of ammonia altered the degree of supersaturation of the growth solution, causing a significant deviation in the morphology and crystal orientation of ZnO nanorods. Field emission scanning Electron Microscopy images revealed changes in surface morphology of ZnO nanorods with respect to addition of specific amounts of ammonia. X-ray diffraction analysis revealed wurtzite crystal structure of ZnO which was further supported by X-ray photoelectron studies, optical absorbance and Raman spectra that also revealed the existence of wurtzite ZnO. The current-voltage measurement showed the electrical properties of the synthesized ZnO nanorods. The vertically grown nanorods with flat tops, effect more rectifying Schottky contacts to be realized on comparison to needle like structures.en_ZA
dc.description.departmentPhysicsen_ZA
dc.description.embargo2018-11-15
dc.description.librarianhj2017en_ZA
dc.description.sponsorshipThe University of Pretoria and National Research Foundation (NRF), South Africa, Grant No: 91550 and 94166.en_ZA
dc.description.urihttp://www.elsevier.com/locate/msspen_ZA
dc.identifier.citationMwankemwa, B.S., Nambala, F.J., Kyeyune, F., Hlatshwayo, T.T., Nel, J.M. & Diale, M. 2017, 'Influence of ammonia concentration on the microstructure, electrical and Raman properties of low temperature chemical bath deposited ZnO nanorods', Materials Science in Semiconductor Processing, vol. 71, pp. 209-216.en_ZA
dc.identifier.issn1369-8001 (print)
dc.identifier.issn1873-4081 (online)
dc.identifier.other10.1016/j.mssp.2017.08.005
dc.identifier.urihttp://hdl.handle.net/2263/62183
dc.language.isoenen_ZA
dc.publisherElsevieren_ZA
dc.rights© 2017 Elsevier Ltd. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Materials Science in Semiconductor Processing. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Materials Science in Semiconductor Processing, vol. 71, pp. 209-216, 2017. doi : 10.1016/j.mssp.2017.08.005.en_ZA
dc.subjectZinc oxide nanostructuresen_ZA
dc.subjectChemical bath depositionen_ZA
dc.subjectGrowth mechanismen_ZA
dc.subjectSurface morphologyen_ZA
dc.subjectX-ray photoelectron spectroscopyen_ZA
dc.subjectElectrical propertiesen_ZA
dc.subjectZinc oxide (ZnO)en_ZA
dc.titleInfluence of ammonia concentration on the microstructure, electrical and Raman properties of low temperature chemical bath deposited ZnO nanorodsen_ZA
dc.typePostprint Articleen_ZA

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