Sensitivity of the antiphasic digits-in-noise test to simulated unilateral and bilateral conductive hearing loss

dc.contributor.authorPolspoel, Sigrid
dc.contributor.authorMoore, David R.
dc.contributor.authorSwanepoel, De Wet
dc.contributor.authorKramer, Sophia E.
dc.contributor.authorSmits, Cas
dc.date.accessioned2023-04-26T09:30:33Z
dc.date.available2023-04-26T09:30:33Z
dc.date.issued2023
dc.description.abstractOBJECTIVES : The objective of this study is (1) to assess whether the presentation level of the antiphasic digits-in-noise (DIN) test affects the speech recognition threshold (SRT), (2) to evaluate how accurately simulated unilateral and bilateral conductive hearing loss is detected (CHL) and (3) to determine whether increasing the presentation level normalises the antiphasic DIN SRT. DESIGN : Participants performed antiphasic and diotic DINs at different presentation levels with unilateral, bilateral or no earplugs. STUDY SAMPLE : Twenty-four and twelve normal hearing adults. RESULTS : Without earplugs, antiphasic DIN SRTs did not differ between 60 and 80 dB SPL. At 60 dB SPL, the antiphasic DIN correctly classified 92% of the unilateral earplug cases; the diotic DIN 25%. The binaural intelligibility level difference did not differ between the no-earplug condition and the condition with bilateral earplugs when the presentation was increased with the attenuation level. CONCLUSIONS : In normal hearing participants, diotic and antiphasic DIN SRTs are independent of presentation level above a minimum level of 60 dB SPL. The antiphasic DIN is more sensitive than the diotic DIN for detecting unilateral CHL; not for bilateral CHL. The effect of CHL on DIN SRTs can be largely compensated by increasing the presentation level. Audibility plays an important role in the antiphasic and diotic DIN.en_US
dc.description.departmentSpeech-Language Pathology and Audiologyen_US
dc.description.librarianhj2023en_US
dc.description.sponsorshipHealth ∼ Holland, Top Sector Life Sciences & Health.en_US
dc.description.urihttps://www.tandfonline.com/loi/iija20en_US
dc.identifier.citationSigrid Polspoel, David R. Moore, De Wet Swanepoel, Sophia E. Kramer & Cas Smits (2023): Sensitivity of the antiphasic digits-in-noise test to simulated unilateral and bilateral conductive hearing loss, International Journal of Audiology, vol. 62, no. 11, 1022–1030, DOI: 10.1080/14992027.2022.2119611.en_US
dc.identifier.issn1499-2027 (print)
dc.identifier.issn1708-8186 (online)
dc.identifier.other10.1080/14992027.2022.2119611
dc.identifier.urihttp://hdl.handle.net/2263/90499
dc.language.isoenen_US
dc.publisherTaylor and Francisen_US
dc.rights© 2022 The Author(s). Published by Informa UK Limited, trading as Taylor & Francis Group on behalf of British Society of Audiology, International Society of Audiology, and Nordic Audiological Society. This is an Open Access article distributed under the terms of the Creative Commons Attribution-NonCommercial-NoDerivatives License (http://creativecommons.org/licenses/by-nc-nd/4.0/).en_US
dc.subjectConductive hearing loss (CHL)en_US
dc.subjectAntiphasic digits-in-noise testen_US
dc.subjectDiotic digits-in-noise testen_US
dc.subjectSpeech recognition threshold (SRT)en_US
dc.subjectPresentation levelen_US
dc.subjectDigits-in-noise (DIN)en_US
dc.titleSensitivity of the antiphasic digits-in-noise test to simulated unilateral and bilateral conductive hearing lossen_US
dc.typeArticleen_US

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