Influence of radiation damage on strontium and iodine diffusion in silicon carbide
dc.contributor.author | Friedland, Erich Karl Helmuth | |
dc.contributor.author | Van der Berg, Nic (Nicolaas George) | |
dc.contributor.author | Malherbe, Johan B. | |
dc.contributor.email | erich.friedland@up.ac.za | en_US |
dc.date.accessioned | 2012-01-18T10:01:06Z | |
dc.date.available | 2012-01-18T10:01:06Z | |
dc.date.issued | 2012 | |
dc.description.abstract | Please read abstract in article. | en |
dc.description.librarian | nf2012 | en |
dc.description.sponsorship | National Research Foundation and the Bundesministerium für Bildung und Forschung. | en_US |
dc.description.uri | http://www.elsevier.com/locate/jnucmat | en_US |
dc.identifier.citation | Friedland, E et al., Influence of radiation damage on strontium and iodine diffusion in silicon carbide, Journal of Nuclear Materials (2012), doi:10.1016/j.jnucmat.2011.10.032 | en |
dc.identifier.issn | 0022-3115 (print) | |
dc.identifier.issn | 1873-4820 (online) | |
dc.identifier.other | 10.1016/j.nucmat.2011.10.032 | |
dc.identifier.uri | http://hdl.handle.net/2263/17811 | |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.rights | © 2011 Published by Elsevier B.V. | en |
dc.subject | Beam analysis | en |
dc.subject | Strontium diffusion | en |
dc.subject | Iodine diffusion | en |
dc.subject | Radiation damage | en |
dc.subject.lcsh | Electron microscopy | en |
dc.subject.lcsh | Silicon carbide -- Effect of radiation on | en |
dc.title | Influence of radiation damage on strontium and iodine diffusion in silicon carbide | en |
dc.type | Postprint Article | en |