EBSD characterisation of the B2 orientation in -TiAl based alloy

dc.contributor.authorMathabathe, Maria Ntsoaki
dc.contributor.authorBolokang, A.S.
dc.contributor.authorGovender, G.
dc.contributor.authorSiyasiya, Charles Witness
dc.contributor.authorMostert, Roelf Johannes
dc.date.accessioned2020-04-21T14:50:35Z
dc.date.available2020-04-21T14:50:35Z
dc.date.issued2019-11-09
dc.description.abstractElectron backscattered diffraction (EBSD) has been conducted to determine the orientation relationship of the remnant B2 phase in an -solidified -Ti-45Al-2Nb-0.3Si (at. %) based intermetallic alloy. The morphology and microstructural characterisation was investigated using conventional methods. The results showed that the B2-grains exhibits a Blackburn orientation relationship (BOR) with the 2 grains viz. {111}B2 // {0001}2 and {110}B2 // {11- 20}2. Moreover, mis-orientation axes of B2-grains were found in the clusters between <101> and <111> in 57-630 angles, in the Y0 directions. In addition, it was also observed that the overall B2 grains in the alloy structure was textured and comprised of high angle boundaries of misorientations above 150 angles.en_ZA
dc.description.departmentMaterials Science and Metallurgical Engineeringen_ZA
dc.description.librarianam2020en_ZA
dc.description.urihttp://iopscience.iop.org/journal/1757-899Xen_ZA
dc.identifier.citationMathabathe, M.N., Bolokang, A.S., Govender, G. et al 2019, 'EBSD characterisation of the B2 orientation in γ-TiAl based alloy', IOP Conference Series: Materials Science and Engineering, vol. 655, art. 012013, pp. 1-6.en_ZA
dc.identifier.issn1757-8981 (print)
dc.identifier.issn1757-899X (online)
dc.identifier.other10.1088/1757-899X/655/1/012013
dc.identifier.urihttp://hdl.handle.net/2263/74339
dc.language.isoenen_ZA
dc.publisherIOP Publishingen_ZA
dc.rightsPublished under licence by IOP Publishing Ltd. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence.en_ZA
dc.subjectConventional methodsen_ZA
dc.subjectB2-grainsen_ZA
dc.subjectElectron backscattered diffraction (EBSD)en_ZA
dc.subjectBlackburn orientation relationship (BOR)en_ZA
dc.subject.otherEngineering, built environment and information technology articles SDG-09
dc.subject.otherSDG-09: Industry, innovation and infrastructure
dc.subject.otherEngineering, built environment and information technology articles SDG-12
dc.subject.otherSDG-12: Responsible consumption and production
dc.subject.otherEngineering, built environment and information technology articles SDG-13
dc.subject.otherSDG-13: Climate action
dc.titleEBSD characterisation of the B2 orientation in -TiAl based alloyen_ZA
dc.typeArticleen_ZA

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