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Browsing University of Pretoria: Research Output by Subject "X-ray diffraction"
Now showing items 1-10 of 10
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(Springer, 2014-05)The crystal structure of a copper antimonite (CuSb2O4) was determined from X-ray powder diffraction data. The structure was solved by simulated annealing in direct space using the Rietveld method. The compound crystallizes ...
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(American Institute of Physics, 2011-01)Strained p-Si1−xGex (x = 5.3%, 10.2%, and 15.4%) was irradiated at room temperature with 160 keV 166Er2+ ions to a fluence of 1×1010 or 3×1013 Er/cm2. The defects induced by ion implantation were investigated experimentally ...
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(World Scientific Publishing, 2019-03)Please read abstract in the article.
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(Elsevier, 2018-06)Please read abstract in the article.
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(Wiley, 2012-06)BACKGROUND: The nutritional quality of cassava complementary porridge was improved through extrusion cooking and compositing with either defatted of full fat soy flour (65 :35 w/w), and product acceptability by mothers ...
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(Routledge, 2012-02)Copper oxide (CuO) nanorod-like structures made of spherical nanocrystals were synthesized at moderate temperature (80◦C) starting from CuCl2·2H2O crystals in a water/n-heptane microemulsion stabilised by the nonionic ...
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(Springer, 2016-02)Crystals of a silico-ferrite of calcium and aluminium (SFCA) and an Al-free SFC were prepared from the melt by slow cooling of synthetically prepared mixtures and examined by single-crystal diffraction methods. Both ...
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Sintering and slagging of mineral matter in South African coals during the coal gasification process (University of Pretoria, 2008-12-19)Coals, from mines in the Highveld coalfield, as well as gasification ash samples were characterised, in order to understand the mineralogical and chemical properties of the individual components in the gasification feedstocks. ...
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(Royal Society of Chemistry, 2016-11)Supported cobalt Fischer–Tropsch catalysts are characteristically nanoparticulate and the reduced SiC supported catalyst was found to contain both HCP and FCC polymorphs. This is reflected in the powder XRD patterns and ...
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(Elsevier, 2013-07)The lattice parameter change of SiC in TRISO particles prepared by chemical vapour deposition (CVD) was measured using high temperature X-ray diffraction, across a temperature range of 25–1400 C. Al2O3 was used as the ...
Now showing items 1-10 of 10