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Browsing Engineering, Built Environment and Information Technology by UP Author "Igumbor, Emmanuel"

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Electrical characterization of electron beam exposure induced defects in epitaxially grown n-type silicon

Danga, Helga Tariro; Auret, Francois Danie; Tunhuma, Shandirai Malven; Omotoso, Ezekiel; Igumbor, Emmanuel; Meyer, Walter Ernst (American Institute of Physics, 2019-06-03)

In this paper, we report on defects introduced in epitaxially grown n-type silicon (Si) during electron beam exposure. The defects observed were electrically characterized using deep-level transient spectroscopy (DLTS) ...

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