Statistics

Statistics

Total Visits

Views
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure 67

Total Visits Per Month

June 2018 July 2018 August 2018 September 2018 October 2018 November 2018 December 2018
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure 1 3 0 0 4 2 2

File Visits

Views
Omotoso_Electrical_2016b.pdf 74

Top country views

Views
United States 22
United Kingdom 15
China 11
South Africa 8
Germany 5
Belarus 2
Russia 1
Sweden 1
Senegal 1
Taiwan 1

Top cities views

Views
Southend 14
Shenzhen 10
Ann Arbor 8
Pretoria 7
Boardman 4
Fremont 4
Ashburn 2
Minsk 2
Champaign 1
Changsha 1