Browsing Conference Papers & Presentations (Electrical, Electronic and Computer Engineering) by Subject "Fault simulation"

Browsing Conference Papers & Presentations (Electrical, Electronic and Computer Engineering) by Subject "Fault simulation"

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  • Osuch, Piotr Jan; Stander, Tinus; Petrashin Pablo; Toledo, Luis; Lancioni, Walter (Institute of Electrical and Electronics Engineers, 2017-02)
    Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first ...