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Browsing Conference Papers & Presentations (Electrical, Electronic and Computer Engineering) by Author "Toledo, Luis"
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Osuch, Piotr Jan; Stander, Tinus; Petrashin Pablo; Toledo, Luis; Lancioni, Walter
(Institute of Electrical and Electronics Engineers, 2017-02)
Oscillation based testing (OBT) has proven to be a
simple yet effective VLSI test for numerous circuit types. In this work,
OBT is applied to test Second-generation Current Conveyor (CCII)
based filters for the first ...