The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes

Msimanga, M.; Wamwangi, D.; Comrie, C.M.; Pineda-Vargas, C.A.; Nkosi, M.; Hlatshwayo, Thulani Thokozani

dc.contributor.author	Msimanga, M.
dc.contributor.author	Wamwangi, D.
dc.contributor.author	Comrie, C.M.
dc.contributor.author	Pineda-Vargas, C.A.
dc.contributor.author	Nkosi, M.
dc.contributor.author	Hlatshwayo, Thulani Thokozani
dc.date.accessioned	2014-11-04T07:38:41Z
dc.date.available	2014-11-04T07:38:41Z
dc.date.issued	2013-02
dc.description.abstract	We report here on the recently built Heavy Ion ERDA set up at iThemba LABS Gauteng; describing a typical application in the study of interfacial reactions in an Al2O3–Ti ceramic–metal multilayer structure annealed in vacuum at 800 C for 2 h. Depth profile extraction was found to be best obtained through combined use of direct calculation and Monte Carlo simulation codes as opposed to using just either of the methods. The obtained profile suggests a case of the Kirkendall effect, whereupon the inter-diffusion between the metal and the ceramic was largely due to the faster diffusion of the metal into the amorphous ceramic than diffusion of the ceramic elements into the metallic layer.	en_US
dc.description.librarian	hb2014	en_US
dc.description.sponsorship	National Research Foundation (iThemba LABS) and the International Atomic Energy Agency (IAEA).	en_US
dc.description.uri	http://www.elsevier.com/locate/nimb	en_US
dc.identifier.citation	Msimanga, M,Wamwangi, D, Comrie, CM, Pineda-Vargas, CA, Nkosi, M & Hlatshwayo, T 2013, 'The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes', Nuclear Instruments and Methods in Physics Research, Section B : Beam Interactions with Materials and Atoms, vol. 296, pp. 54-60.	en_US
dc.identifier.issn	0168-583X (print)
dc.identifier.issn	1872-9584 (online)
dc.identifier.other	10.1016/j.nimb.2012.11.015
dc.identifier.uri	http://hdl.handle.net/2263/42480
dc.language.iso	en	en_US
dc.publisher	Elsevier	en_US
dc.rights	© 2012 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 296, pp. 54-60, 2013. doi : 10.1016/j.nimb.2012.11.015.	en_US
dc.subject	Heavy Ion ERDA	en_US
dc.subject	Energy resolution	en_US
dc.subject	Multiple scattering	en_US
dc.subject	Depth profiling	en_US
dc.subject	Kirkendall effect	en_US
dc.title	The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes	en_US
dc.type	Postprint Article	en_US