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Rutherford backscattering spectrometry (RBS) (4) |
Scanning electron microscopy (SEM) (4) |
Silicon carbide (SiC) (4) |
Annealing (2) |
Raman spectroscopy (2) |
A-carbon (1) |
Carbon (1) |
Diffusion (1) |
Elastic recoil detection analysis (ERDA) (1) |
Free carbon (1) |
Grazing incidence X-ray diffraction (GIXRD) (1) |
Heavy ions (1) |
Interface (1) |
Iodine compounds (1) |
Irradiated samples (1) |
Irradiation (1) |
Polycrystalline (1) |
Polycrystalline SiC (1) |
Radiation damage (1) |
Reactions (1) |
Recrystallization (metallurgy) (1) |
Rubidium (1) |
Silicon compounds (1) |
Silver (Ag) (1) |
Sr and implantation (1) |
Strontium (1) |
Strontium (Sr) (1) |
Swift heavy ion (SHI) (1) |
Transmission electron microscopy (TEM) (1) |
Tungsten (W) (1) |
Now showing items 1-30