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Scanning electron microscopy (SEM) (4) |
SiC (4) |
Microstructure (2) |
Nuclear materials (2) |
Annealing (1) |
Bubbles (1) |
Defects (1) |
Grazing incidence X-ray diffraction (GIXRD) (1) |
Implantation (1) |
Interface (1) |
Now showing items 1-10