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Rutherford backscattering spectrometry (RBS) (3) |
Scanning electron microscopy (SEM) (3) |
Raman spectroscopy (2) |
Silicon carbide (SiC) (2) |
Swift heavy ion (SHI) (2) |
Transmission electron microscopy (TEM) (2) |
A-carbon (1) |
Annealing (1) |
Carbon (1) |
Elastic recoil detection analysis (ERDA) (1) |
Now showing items 1-10