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Annealing (2) |
Rutherford backscattering spectrometry (RBS) (2) |
Scanning electron microscopy (SEM) (2) |
Silicon carbide (SiC) (2) |
A-carbon (1) |
Carbon (1) |
Free carbon (1) |
Grazing incidence X-ray diffraction (GIXRD) (1) |
Heavy ions (1) |
Interface (1) |
Now showing items 1-10