Now showing items 1-9
Amorphization (1) |
Atomic force microscopy (AFM) (1) |
Cavities (1) |
Helium (He) (1) |
Raman spectroscopy (1) |
Rutherford backscattering spectrometry (RBS) (1) |
Scanning electron microscopy (SEM) (1) |
SiC crystal structure (1) |
Transmission electron microscopy (TEM) (1) |
Now showing items 1-9