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Showing 7 out of a total of 17 results for community: Natural and Agricultural Sciences.
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High-resolution DLTS of vacancy–donor pairs in P-, As- and Sb-doped silicon
Auret, Francois Danie
;
Peaker, A.R.
;
Markevich, V.P.
;
Dobaczewski, L.
;
Gwilliam, R.M.
(
Elsevier
,
2006-04
)
Damage formation in Ge during Ar+ and He+ implantation at 15 K
Hayes, M.
;
Schroeter, A.
;
Wendler, E.
;
Wesch, W.
;
Auret, Francois Danie
;
Nel, Jacqueline Margot
(
Elsevier
,
2009
)
Electronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction band
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Janse van Rensburg, Pieter Johan
;
Hayes, M.
;
Nel, Jacqueline Margot
;
Von Wenckstern, Holger
;
Schmidt, H.
;
Biehne, G.
;
Hochmuth, H.
;
Lorenz, M.
;
Grundmann, Marius
(
Elsevier
,
2007-12
)
Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition
Nyamhere, Cloud
;
Chawanda, Albert
;
Das, A.G.M.
;
Auret, Francois Danie
;
Hayes, M.
(
Elsevier
,
2007-12-15
)
Microstructural and surface characterization of thin gold films on n-Ge (111)
Nel, Jacqueline Margot
;
Chawanda, Albert
;
Auret, Francois Danie
;
Jordaan, W.
;
Odendaal, R.Q. (Quintin)
;
Hayes, M.
;
Coelho, Sergio M.M.
(
Elsevier
,
2009
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS
Nyamhere, Cloud
;
Deenapanray, P.N.K.
;
Auret, Francois Danie
;
Farlow, F.C.
(
Elsevier
,
2006
)
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Author
Auret, Francois Danie (17)
Janse van Rensburg, Pieter Johan (8)
Meyer, Walter Ernst (7)
Coelho, Sergio M.M. (6)
Hayes, M. (6)
Nel, Jacqueline Margot (5)
Nyamhere, Cloud (5)
Chawanda, Albert (4)
Das, A.G.M. (2)
Diale, M. (Mmantsae Moche) (2)
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Deep level transient spectroscopy (12)
Defects (8)
Diodes, Schottky-barrier (5)
DLTS (5)
Germanium (4)
Implantation (3)
Barrier height (2)
Electron beams (2)
Ge (2)
Germanium -- Defects (2)
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2009 (11)
2007 (3)
2006 (2)
2002 (1)
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