Optical characterization of semiconductors using photo reflection spectroscopy

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dc.contributor.advisor Brink, D.J. en
dc.contributor.postgraduate Sieberhagen, Rheinhardt Hendrik en
dc.date.accessioned 2013-09-07T16:31:07Z
dc.date.available 2005-11-30 en
dc.date.available 2013-09-07T16:31:07Z
dc.date.created 2002-04-01 en
dc.date.issued 2006-11-30 en
dc.date.submitted 2005-11-24 en
dc.description Dissertation (MSc (Physics))--University of Pretoria, 2006. en
dc.description.abstract The study of semiconductor materials and more recently, artificially struc¬tured materials, is important for both scientific and industrial purposes. Many techniques have been developed to characterize the electronic properties of these materials. Optical characterization is a popular approach to this field of study, as the absorption or reflection of incident photons is directly related to the band structure of a semiconductor material. When measuring the absolute reflectivity or absorptivity, the resulting spec¬trum is often rather featureless, making it difficult to observe band structure features. This led to the invention of modulation spectroscopy techniques where the derivative of the absorptivity or reflectivity of a semiconductor ma¬terial with respect to some experimental parameter, is evaluated. Weak fea¬tures in the absolute spectrum are thus enhanced, making the identification of band structure features easier. This study describes the technique of photo reflection spectroscopy (com¬monly known as photoreflectance spectroscopy) where modulation is achiev¬ed optically. The theory behind photoreflectance spectroscopy is discussed in detail, whereafter the practical implementation is described. This is followed by measurements done on GaAs to do a basic comparison with published re¬sults. Finally, three different doping superlattices were investigated with this technique; including the influence that a-particle irradiation and consequent annealing have on the measured photoreflectance spectra. en
dc.description.availability unrestricted en
dc.description.department Physics en
dc.identifier.citation Sieberhagen, RH 2002, Optical characterization of semiconductors using photo reflection spectroscopy, MSc dissertation, University of Pretoria, Pretoria, viewed yymmdd < http://hdl.handle.net/2263/29754 > en
dc.identifier.other H469/ag en
dc.identifier.upetdurl http://upetd.up.ac.za/thesis/available/etd-11242005-142711/ en
dc.identifier.uri http://hdl.handle.net/2263/29754
dc.language.iso en
dc.publisher University of Pretoria en_ZA
dc.rights © 2002, University of Pretoria. All rights reserved. The copyright in this work vests in the University of Pretoria. No part of this work may be reproduced or transmitted in any form or by any means, without the prior written permission of the University of Pretoria. en
dc.subject Semiconductors properties en
dc.subject Photoelectron spectroscopy en
dc.subject UCTD en_US
dc.title Optical characterization of semiconductors using photo reflection spectroscopy en
dc.type Dissertation en


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