Surface roughness of InP after N+2 bombardment : Ion areic dose dependence

Osman, Sarah Omer Siddig

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dc.contributor.advisor	Malherbe, Johan B.	en
dc.contributor.coadvisor	Van den Berg, Noelani	en
dc.contributor.postgraduate	Osman, Sarah Omer Siddig	en
dc.date.accessioned	2013-09-06T18:03:35Z
dc.date.available	2005-05-20	en
dc.date.available	2013-09-06T18:03:35Z
dc.date.created	2004-09-01	en
dc.date.issued	2006-05-20	en
dc.date.submitted	2005-05-13	en
dc.description	Dissertation (MSc (Physics))--University of Pretoria, 2006.	en
dc.description.abstract	Please read the abstract in the section front of this document.	en
dc.description.availability	unrestricted	en
dc.description.department	Physics	en
dc.identifier.citation	Osman, SOS 2004, Surface roughness of InP after N+2 bombardment: Ion areic dose dependence, MSc dissertation, University of Pretoria, Pretoria, viewed yymmdd < http://hdl.handle.net/2263/24608 >	en
dc.identifier.other	H250/ag	en
dc.identifier.upetdurl	http://upetd.up.ac.za/thesis/available/etd-05132005-105139/	en
dc.identifier.uri	http://hdl.handle.net/2263/24608
dc.language.iso		en
dc.publisher	University of Pretoria	en_ZA
dc.rights	© 2004, University of Pretoria. All rights reserved. The copyright in this work vests in the University of Pretoria. No part of this work may be reproduced or transmitted in any form or by any means, without the prior written permission of the University of Pretoria.	en
dc.subject	Electronics materials	en
dc.subject	Indium compounds	en
dc.subject	Semiconducrtors	en
dc.subject	Surface roughness	en
dc.subject	Indium phosphide	en
dc.subject	UCTD	en_US
dc.title	Surface roughness of InP after N+2 bombardment : Ion areic dose dependence	en
dc.type	Dissertation	en