Advanced process monitoring using wavelets and non-linear principal component analysis

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dc.contributor.advisor De Vaal, Philip L. en
dc.contributor.postgraduate Fourie, Steven en
dc.date.accessioned 2013-09-06T14:10:13Z
dc.date.available 2007-01-12 en
dc.date.available 2013-09-06T14:10:13Z
dc.date.created 2000-04-01 en
dc.date.issued 2007-01-12 en
dc.date.submitted 2007-01-12 en
dc.description Dissertation (M Eng (Control Engineering))--University of Pretoria, 2007. en
dc.description.abstract The aim of this study was to propose a nonlinear multiscale principal component analysis (NLMSPCA) methodology for process monitoring and fault detection based upon multilevel wavelet decomposition and nonlinear principal component analysis via an input-training neural network. Prior to assessing the capabilities of the monitoring scheme on a nonlinear industrial process, the data is first pre-processed to remove heavy noise and significant spikes through wavelet thresholding. The thresholded wavelet coefficients are used to reconstruct the thresholded details and approximations. The significant details and approximations are used as the inputs for the linear and nonlinear PCA algorithms in order to construct detail and approximation conformance models. At the same time non-thresholded details and approximations are reconstructed and combined which are used in a similar way as that of the thresholded details and approximations to construct a combined conformance model to take account of noise and outliers. Performance monitoring charts with non-parametric control limits are then applied to identify the occurrence of non-conforming operation prior to interrogating differential contribution plots to help identify the potential source of the fault. A novel summary display is used to present the information contained in bivariate graphs in order to facilitate global visualization. Positive results were achieved. en
dc.description.availability unrestricted en
dc.description.department Chemical Engineering en
dc.identifier.citation Fourie, S 2000, Advance process monitoring using wavelets and non-linear principal component analysis, MEng dissertation, University of Pretoria, Pretoria, viewed yymmdd < http://hdl.handle.net/2263/22967 > en
dc.identifier.other H643/ag en
dc.identifier.upetdurl http://upetd.up.ac.za/thesis/available/etd-01122007-110812/ en
dc.identifier.uri http://hdl.handle.net/2263/22967
dc.language.iso en
dc.publisher University of Pretoria en_ZA
dc.rights © 2000, University of Pretoria. All rights reserved. The copyright in this work vests in the University of Pretoria. No part of this work may be reproduced or transmitted in any form or by any means, without the prior written permission of the University of Pretoria. en
dc.subject Process monitoring en
dc.subject Non-linear principal component analysis en
dc.subject Fault detection en
dc.subject UCTD en_US
dc.title Advanced process monitoring using wavelets and non-linear principal component analysis en
dc.type Dissertation en


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