Optoelectronic characterization of Au/Ni/n-AIGaN photodiodes after annealing at different temperatures

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dc.contributor.author Ngoepe, Phuti Ngako Mahloka
dc.contributor.author Meyer, Walter Ernst
dc.contributor.author Diale, M. (Mmantsae Moche)
dc.contributor.author Auret, Francois Danie
dc.contributor.author Van Schalkwyk, Louwrens
dc.date.accessioned 2012-06-12T06:09:34Z
dc.date.available 2012-06-12T06:09:34Z
dc.date.issued 2012-06
dc.description.abstract Please read abstract in the article. en_US
dc.description.librarian nf2012 en
dc.description.uri http://www.elsevier.com/locate/physb en_US
dc.identifier.citation P.N.M. Ngoepe, W.E. Meyer, M. Diale, F.D. Auret, L.van Schalkwyk, Optoelectronic characterization of Au/Ni/n-AIGaN photodiodes after annealing at different temperatures, Physica B, vol. 407, no. 10, pp. 1628-1630 (2012), doi: 10.1016/j.physb.2011.09.102 en
dc.identifier.issn 0921-4526 (print)
dc.identifier.issn 1873-2135 (online)
dc.identifier.other 10.1016/j.physb.2011.09.102
dc.identifier.uri http://hdl.handle.net/2263/19144
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.rights © 2011 Elsevier B.V. All rights reserved. en_US
dc.subject Annealing en
dc.subject Schottky photodiodes en
dc.subject AlGaN en
dc.subject.lcsh Photodiodes en
dc.subject.lcsh Optoelectronics en
dc.title Optoelectronic characterization of Au/Ni/n-AIGaN photodiodes after annealing at different temperatures en
dc.type Postprint Article en


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