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Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Ngoepe, Phuti Ngako Mahloka
(
Trans Tech Publications
,
2016
)
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Author
Auret, Francois Danie (2)
Coelho, Sergio M.M. (1)
Diale, M. (Mmantsae Moche) (1)
Legodi, Matshisa Johannes (1)
Meyer, Walter Ernst (1)
Ngoepe, Phuti Ngako Mahloka (1)
Omotoso, Ezekiel (1)
Tunhuma, Shandirai Malven (1)
Subject
Defects (2)
Silicon carbide (2)
Capacitance (1)
Capacitance voltage measurements (1)
Current voltage (1)
Deep level transient spectroscopy (DLTS) (1)
Deep-level transient spectroscopy (DLTS) (1)
Deposition (1)
Depth profiling (1)
Electrical characterization (1)
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2016 (1)
2018 (1)
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