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Showing 10 out of a total of 72 results for collection: Research Articles (Physics).
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Thermal annealing behaviour of Pd Schottky contacts on melt-grown single crystal ZnO studied by IV and CV measurements
Mtangi, Wilbert
;
Auret, Francois Danie
;
Chawanda, Albert
;
Jansen van Rensburg, P. J.
;
Coelho, Sergio M.M.
;
Nel, J.M.
;
Diale, M. (Mmantsae Moche)
;
Van Schalkwyk, Louwrens
;
Nyamhere, Cloud
(
Elsevier
,
2012-10
)
Defects induced by solid state reactions at the tungsten-silicon carbide interface
Tunhuma, Shandirai Malven
;
Diale, M. (Mmantsae Moche)
;
Legodi, Matshisa Johannes
;
Nel, Jacqueline Margot
;
Thabethe, Thabsile Theodora
;
Auret, Francois Danie
(
American Institute of Physics Inc.
,
2018-01-18
)
Properties of ITO thin films rapid thermally annealed in different exposures of nitrogen gas
Ollotu, E.R.
;
Nyarige, Justine Sageka
;
Mlyuka, N.R.
;
Samiji, M.E.
;
Diale, M. (Mmantsae Moche)
(
Springer
,
2020-10
)
DLTS characterization of defects in GaN induced by electron beam exposure
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-06
)
In situ study of low-temperature irradiation-induced defects in silicon carbide
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Danga, Helga Tariro
;
Nel, Jacqueline Margot
;
Diale, M. (Mmantsae Moche)
(
Springer
,
2019-06
)
Use of interfacial layers to prolong hole lifetimes in hematite probed by ultrafast transient absorption spectroscopy
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Maabong, Kelebogile
;
Kruger, T.P.J. (Tjaart)
(
Elsevier
,
2018-04
)
Laplace current deep level transient spectroscopy measurements of defect states in methylammonium lead bromide single crystals
Rosenberg, John W.
;
Legodi, M.J. (Matshisa Johannes)
;
Rakita, Yevgeny
;
Cahen, David
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2017
)
Ab initio studies of bimetallic-doped {0001} hematite surface for enhanced photoelectrochemical water splitting
Simfukwe, Joseph
;
Mapasha, Refilwe Edwin
;
Braun, Artur
;
Diale, M. (Mmantsae Moche)
(
MDPI
,
2021-08
)
Optoelectronic characterization of Au/Ni/n-AIGaN photodiodes after annealing at different temperatures
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Diale, M. (Mmantsae Moche)
;
Auret, Francois Danie
;
Van Schalkwyk, Louwrens
(
Elsevier
,
2012-06
)
Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
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Author
Diale, M. (Mmantsae Moche) (72)
Auret, Francois Danie (36)
Nel, Jacqueline Margot (17)
Meyer, Walter Ernst (16)
Mtangi, Wilbert (11)
Omotoso, Ezekiel (11)
Paradzah, Alexander Tapera (10)
Chawanda, Albert (9)
Kruger, T.P.J. (Tjaart) (9)
Legodi, Matshisa Johannes (9)
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Deep level transient spectroscopy (DLTS) (11)
Annealing (8)
Hematite (8)
Defects (7)
Barrier height (6)
Deep-level transient spectroscopy (DLTS) (6)
Schottky contacts (6)
Photoelectrochemical (PEC) (5)
Water splitting (5)
4H-SiC (4)
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2020 - 2024 (24)
2010 - 2019 (46)
2009 - 2009 (2)
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