Munthali, Kinnock V.; Theron, C.C. (Chris); Auret, Francois Danie; Coelho, Sergio M.M.; Njoroge, Eric Gitau
(Springer, 2015-10)
Thin films of ruthenium-on-6-hexagonal silicon carbide (6H-SiC) were analysed by Rutherford backscattering
spectroscopy (RBS) at various annealing temperatures. Some thin film samples were also analysed by scanning
electron ...