Ollotu, E.R.; Nyarige, Justine Sageka; Mlyuka, N.R.; Samiji, M.E.; Diale, M. (Mmantsae Moche)
(Springer, 2020-10)
Indium tin oxide (ITO) thin films were rapid thermal annealed (RTA) for 5 min at a temperature of 550 °C in different exposures of nitrogen gas. Effects of these exposures on the structural, morphological, electrical, and ...