Ngoepe, Noko Nepo; De Villiers, J.P.R. (Johan)
(Elsevier, 2013-07)
The lattice parameter change of SiC in TRISO particles prepared by chemical vapour deposition (CVD) was measured using high temperature X-ray diffraction, across a temperature range of 25–1400 C. Al2O3 was used as the ...