Bogalecki, Alfons Willi; Du Plessis, Monuko; Venter, Petrus Johannes; Janse van Rensburg, Christo
(South African Institute of Electrical Engineers, 2012-03)
The emission spectra of pn-junction and punch-through (PT) carrier injection silicon (Si)
CMOS light sources were measured at various current densities and temperatures. In contrast to the
narrow-band forward-biased ...