Browsing Research Articles (Electrical, Electronic and Computer Engineering) by Author "Toledo, Luis"

Browsing Research Articles (Electrical, Electronic and Computer Engineering) by Author "Toledo, Luis"

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  • Oscillation-based test applied to a wideband CCII 
    Petrashin, Pablo; Toledo, Luis; Lancioni, Walter; Osuch, Piotr Jan; Stander, Tinus (Hindawi Publishing, 2017)
    Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation ...