Goosen, Marius Eugene; Venter, Petrus J.; Faure, Nicolaas M.; Msomi, Promise N.; Schoeman, Johan; Joubert, Trudi-Heleen
(Elsevier, 2023-06)
This paper investigates the degradation and reliability of polysilicon light emitters implemented in a standard 0.35 μm CMOS process. A total of 48 identical hot carrier electroluminescent emitters were subjected to high ...