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Browsing Electrical, Electronic and Computer Engineering by Subject "Gain standard"

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Three-antenna characterization techniques employing spherical near-field scanning with higher-order probe correction

Mayhew-Ridgers, Gordon; Van Jaarsveld, Paul A.; Odendaal, J.W. (Johann Wilhelm) (Institute of Electrical and Electronics Engineers, 2023-09)

The three-antenna technique is typically used in the context of absolute-gain measurements where no gain standard is required. When implemented in a spherical near-field test range, the conventional approach is to use ...

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