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Scanning electron microscopy (SEM) (3) |
X-ray diffraction (XRD) (3) |
Irradiation (2) |
Silicon carbide (SiC) (2) |
Swift heavy ion (SHI) (2) |
Biaxial stress (1) |
Crystallinities (1) |
Deep level transient spectroscopy (DLTS) (1) |
Defects induced (1) |
Electrically active defects (1) |
Now showing items 1-10