Now showing items 1-10
Deep level transient spectroscopy (DLTS) (8) |
Defects (3) |
Alpha particle irradiation (2) |
Defect (2) |
Electron beam exposure (2) |
4H-SiC (1) |
4H–silicon carbide (1) |
Alpha-particle irradiation (1) |
Au/Ni Schottky diodes (1) |
Band gap states (1) |
Now showing items 1-10